mtd_config_fs: support align size test
Originally 1-byte alignment, now supports n-byte alignment Signed-off-by: zhaoxingyu1 <zhaoxingyu1@xiaomi.com>
This commit is contained in:
zhaoxingyu1
Xiang Xiao
parent
b4ec000dec
commit
3cbda8a24c
@ -48,6 +48,8 @@
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****************************************************************************/
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/* Configuration ************************************************************/
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#define NVS_ALIGN_SIZE CONFIG_MTD_WRITE_ALIGN_SIZE
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#define NVS_ALIGN_UP(x) (((x) + NVS_ALIGN_SIZE - 1) & ~(NVS_ALIGN_SIZE - 1))
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#define TEST_KEY1 "testkey1"
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#define TEST_KEY2 "testkey2"
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@ -62,14 +64,21 @@
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begin_packed_struct struct nvs_ate
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{
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uint32_t id; /* data id */
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uint16_t offset; /* data offset within sector */
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uint16_t len; /* data len within sector */
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uint16_t key_len; /* key string len */
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uint8_t part; /* part of a multipart data - future extension */
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uint8_t crc8; /* crc8 check of the ate entry */
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uint8_t expired; /* 0xFF-newest entry, others-old entry */
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uint8_t reserved[3]; /* for future extension */
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uint32_t id; /* Data id */
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uint16_t offset; /* Data offset within block */
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uint16_t len; /* Data len within block */
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uint16_t key_len; /* Key string len */
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uint8_t part; /* Part of a multipart data - future extension */
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uint8_t crc8; /* Crc8 check of the ate entry */
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#if CONFIG_MTD_WRITE_ALIGN_SIZE <= 4
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/* stay compatible with situation which align byte be 1 */
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uint8_t expired[NVS_ALIGN_SIZE];
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uint8_t reserved[4 - NVS_ALIGN_SIZE];
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#else
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uint8_t padding[NVS_ALIGN_UP(12) - 12];
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uint8_t expired[NVS_ALIGN_SIZE];
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#endif
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} end_packed_struct;
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/* Pre-allocated simulated flash */
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@ -183,7 +192,7 @@ static void fill_ate(FAR struct mtdnvs_ctx_s *ctx, FAR struct nvs_ate *ate,
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ate->offset = offset;
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ate->key_len = strlen(key) + 1;
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fill_crc8_update(ate);
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ate->expired = expired ? 0x7f : 0xff;
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ate->expired[0] = expired ? 0x7f : 0xff;
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}
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/****************************************************************************
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@ -487,6 +496,7 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s *ctx)
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uint8_t erase_value = ctx->erasestate;
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struct config_data_s data;
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char rd_buf[50];
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size_t padding_size;
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printf("%s: test begin\n", __func__);
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@ -513,6 +523,18 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s *ctx)
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goto test_fail;
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}
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padding_size = NVS_ALIGN_UP(sizeof(TEST_KEY1) + sizeof(TEST_DATA1))
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- sizeof(TEST_KEY1) - sizeof(TEST_DATA1);
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for (i = 0; i < padding_size; i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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{
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printf("%s:write data1 padding failed, ret=%d\n", __func__, ret);
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goto test_fail;
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}
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}
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/* write valid data again, simulate overwrite data */
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ret = write(mtd_fd, TEST_KEY1, strlen(TEST_KEY1) + 1);
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@ -531,9 +553,9 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff */
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for (i = 2 * (strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2);
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16;
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i++)
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for (i = 2 * (strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2) + padding_size;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 4 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -546,7 +568,7 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s *ctx)
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/* Write ate */
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fill_ate(ctx, &ate, TEST_KEY1, strlen(TEST_DATA2) + 1,
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strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2, false);
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strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2 + padding_size, false);
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ret = write(mtd_fd, &ate, sizeof(ate));
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if (ret != sizeof(ate))
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{
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@ -575,7 +597,8 @@ static void test_nvs_corrupt_expire(struct mtdnvs_ctx_s *ctx)
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/* write close ate, mark section 0 as closed */
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fill_close_ate(ctx, &ate,
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16);
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 4 * sizeof(struct nvs_ate));
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ret = write(mtd_fd, &ate, sizeof(ate));
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if (ret != sizeof(ate))
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{
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@ -672,6 +695,7 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s *ctx)
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uint8_t erase_value = ctx->erasestate;
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struct nvs_ate ate;
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struct config_data_s data;
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size_t padding_size;
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printf("%s: test begin\n", __func__);
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@ -700,6 +724,18 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s *ctx)
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goto test_fail;
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}
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padding_size = NVS_ALIGN_UP(sizeof(key1) + sizeof(wr_buf_1))
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- sizeof(key1) - sizeof(wr_buf_1);
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for (i = 0; i < padding_size; i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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{
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printf("%s:write data1 padding failed, ret=%d\n", __func__, ret);
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goto test_fail;
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}
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}
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/* power loss occurs after we write data */
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ret = write(mtd_fd, key1, sizeof(key1));
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@ -718,9 +754,9 @@ static void test_nvs_corrupted_write(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff */
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for (i = 2 * (sizeof(key1) + sizeof(wr_buf_1));
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 3 * 16;
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i++)
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for (i = 2 * (sizeof(key1) + sizeof(wr_buf_1)) + padding_size;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 3 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -830,9 +866,15 @@ static void test_nvs_gc(struct mtdnvs_ctx_s *ctx)
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uint16_t id;
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const uint16_t max_id = 10;
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/* 4096 * 2 / (44 + 4 + 16) = 128, 129 write will trigger GC. */
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/* max_writes will trigger GC. */
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const uint16_t max_writes = 129;
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size_t kv_size = NVS_ALIGN_UP(44 + 4) + sizeof(struct nvs_ate);
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size_t block_max_write_size =
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- sizeof(struct nvs_ate);
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uint16_t block_max_write_nums = block_max_write_size / kv_size;
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const uint16_t max_writes = block_max_write_nums + 1;
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printf("%s: test begin\n", __func__);
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@ -1099,17 +1141,19 @@ test_fail:
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static void test_nvs_gc_3sectors(struct mtdnvs_ctx_s *ctx)
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{
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int ret;
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const uint16_t max_id = 64;
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/* 4096 * 2 / (44 + 4 + 16) = 128, 129 write will trigger GC. */
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/* max_writes will trigger GC */
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const uint16_t max_writes = 129;
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size_t kv_size = NVS_ALIGN_UP(44 + 4) + sizeof(struct nvs_ate);
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size_t block_max_write_size =
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- sizeof(struct nvs_ate);
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uint16_t max_id = block_max_write_size / kv_size;
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/* 4096 / (44 + 4 + 16) = 64, 129 + 64 write will trigger 2st GC. */
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const uint16_t max_writes_2 = 129 + 64;
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const uint16_t max_writes_3 = 129 + 64 + 64;
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const uint16_t max_writes_4 = 129 + 64 + 64 + 64;
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const uint16_t max_writes = max_id + 1;
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const uint16_t max_writes_2 = max_writes + max_id;
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const uint16_t max_writes_3 = max_writes_2 + max_id;
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const uint16_t max_writes_4 = max_writes_3 + max_id;
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printf("%s: test begin\n", __func__);
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@ -1291,9 +1335,9 @@ test_fail:
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static void test_nvs_corrupted_sector_close(struct mtdnvs_ctx_s *ctx)
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{
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int ret;
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uint8_t rd_buf[512];
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uint8_t wr_buf[512];
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char key1[] = TEST_KEY1;
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uint8_t rd_buf[NVS_ALIGN_UP(512) - sizeof(key1)];
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uint8_t wr_buf[NVS_ALIGN_UP(512) - sizeof(key1)];
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int mtd_fd = -1;
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int nvs_fd = -1;
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int loop_section;
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@ -1343,8 +1387,8 @@ static void test_nvs_corrupted_sector_close(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff */
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for (i = 2 * (sizeof(key1) + sizeof(wr_buf));
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16;
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i++)
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 4 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -1394,7 +1438,8 @@ static void test_nvs_corrupted_sector_close(struct mtdnvs_ctx_s *ctx)
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else
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{
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fill_close_ate(ctx, &ate,
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 4 * 16);
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CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 4 * sizeof(struct nvs_ate));
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}
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ret = write(mtd_fd, &ate, sizeof(ate));
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@ -1690,8 +1735,8 @@ static void test_nvs_gc_corrupt_close_ate(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff */
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for (i = strlen(TEST_KEY1) + strlen(TEST_DATA1) + 2;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 6 * 16;
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i++)
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 6 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -1713,9 +1758,10 @@ static void test_nvs_gc_corrupt_close_ate(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff */
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 5 * 16;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 2 * 16;
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i++)
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 5 * sizeof(struct nvs_ate);
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 2 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -1748,8 +1794,8 @@ static void test_nvs_gc_corrupt_close_ate(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff in section 1 */
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 16;
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i++)
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -1879,8 +1925,10 @@ static void test_nvs_gc_corrupt_ate(struct mtdnvs_ctx_s *ctx)
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goto test_fail;
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}
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE / 2 + 16;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 32; i++)
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE / 2
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+ sizeof(struct nvs_ate);
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- 2 * sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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@ -1914,8 +1962,8 @@ static void test_nvs_gc_corrupt_ate(struct mtdnvs_ctx_s *ctx)
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/* set unused flash to 0xff in section 1 */
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for (i = CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE;
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE - 16;
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i++)
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i < CONFIG_TESTING_MTD_CONFIG_FAIL_SAFE_FLASH_SECTION_SIZE
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- sizeof(struct nvs_ate); i++)
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{
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ret = write(mtd_fd, &erase_value, sizeof(erase_value));
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if (ret != sizeof(erase_value))
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