drivertest_block:Give redundant space for bad blocks in nand flash

Signed-off-by: chenrun1 <chenrun1@xiaomi.com>
This commit is contained in:
chenrun1 2023-06-05 14:07:04 +08:00 committed by Xiang Xiao
parent 3cb5d475ae
commit 9768cfab79

View File

@ -27,6 +27,7 @@
#include <sys/mount.h>
#include <sys/ioctl.h>
#include <sys/stat.h>
#include <sys/types.h>
#include <stdarg.h>
#include <stddef.h>
@ -44,6 +45,12 @@
* Private Type
****************************************************************************/
/****************************************************************************
* Pre-processor Definitions
****************************************************************************/
#define SECTORS_RANGE 0.95
/****************************************************************************
* Private Types
****************************************************************************/
@ -133,8 +140,10 @@ static inline char blktest_randchar(void)
* Name: blktest_randcontext
****************************************************************************/
static void blktest_randcontext(FAR struct pre_build_s *pre, char *input)
static void blktest_randcontext(FAR struct pre_build_s *pre, FAR char *input)
{
/* Construct a buffer here and fill it with random characters */
int i;
for (i = 0; i < pre->cfg.geo_sectorsize - 1; i++)
{
@ -150,7 +159,7 @@ static void blktest_randcontext(FAR struct pre_build_s *pre, char *input)
static int setup(FAR void **state)
{
FAR struct pre_build_s *pre = (FAR struct pre_build_s *)*state;
FAR struct pre_build_s *pre = *state;
struct stat mode;
time_t t;
int ret;
@ -180,40 +189,55 @@ static void blktest_stress(FAR void **state)
FAR struct pre_build_s *pre;
FAR char *input;
FAR char *output;
blkcnt_t nsectors;
uint32_t input_crc;
uint32_t output_crc;
int ret;
pre = (FAR struct pre_build_s *)*state;
pre = *state;
input = malloc(pre->cfg.geo_sectorsize);
input = malloc(pre->cfg.geo_sectorsize * 2);
assert_true(input != NULL);
output = malloc(pre->cfg.geo_sectorsize);
assert_true(output != NULL);
output = input + pre->cfg.geo_sectorsize;
for (int i = 0; i < pre->cfg.geo_nsectors; i++)
/* We expect the physical bad block rate on nand flash to be no more
* than 5%, we give the redundancy space at the end.
*/
nsectors = pre->cfg.geo_nsectors * SECTORS_RANGE;
/* Test process: convert the device information of the storage device into
* 'sectors' by bch, and fill each 'sector' with random characters, then
* read it out and compare whether the writing and The difference between
* write and store is verified by crc32.
* This behavior simulates the behavior of commands such as 'dd' in the
* system. The general flow is user->bch->ftl->driver
*/
for (int i = 0; i < nsectors; i++)
{
input_crc = 0;
output_crc = 0;
lseek(pre->fd, i * pre->cfg.geo_sectorsize, SEEK_SET);
blktest_randcontext(pre, input);
input_crc = crc32((FAR uint8_t *)input, pre->cfg.geo_sectorsize);
ret = write(pre->fd, input, pre->cfg.geo_sectorsize);
assert_true(ret == pre->cfg.geo_sectorsize);
fsync(pre->fd);
/* Let's write each time we need to move the pointer back to the
* beginning
*/
lseek(pre->fd, i * pre->cfg.geo_sectorsize, SEEK_SET);
ret = read(pre->fd, output, pre->cfg.geo_sectorsize);
assert_int_equal(ret, pre->cfg.geo_sectorsize);
output_crc = crc32((FAR uint8_t *)output, pre->cfg.geo_sectorsize);
assert_false(output_crc != input_crc);
}
free(input);
free(output);
}
/****************************************************************************