nuttx-apps/examples/flash_test
Xiang Xiao 857158451b Unify the void cast usage
1.Remove void cast for function because many place ignore the returned value witout cast
2.Replace void cast for variable with UNUSED macro

Change-Id: Ie644129a563244a6397036789c4c3ea83c4e9b09
Signed-off-by: Xiang Xiao <xiaoxiang@xiaomi.com>
2020-01-02 23:21:01 +08:00
..
.gitignore
flash_test.c Unify the void cast usage 2020-01-02 23:21:01 +08:00
Kconfig Application.mk and main.c files: Change builtin's entry point from main to xxx_main by macro expansion. This change make the entry point fully compliant with POSIX/ANSI standard. 2019-10-06 06:14:56 -06:00
Make.defs apps/: In all Make.def files, append to CONFIGURED_APPS patch with the absolute path. 2019-10-17 11:33:59 -06:00
Makefile Makefiles: This reverts part of commit cf0365ea9. It restores 'conditional' inclusion of TOPDIR/Make.defs. Otherwise all make targets fail if the board has not been configured. That is okay most of the time, but not for things like clean and distclean which should not depend on being configured. 2019-10-15 09:25:48 +08:00
README.txt

Install Program
===============

    Source: NuttX
    Author: Ken Pettit
    Date: April 24, 2013

This application performs a SMART flash block device test.  This test performs a sector allocate, read, write, free and garbage collection test on a SMART MTD block device.  This test can be built only as an NSH command

NOTE:  This test uses internal OS interfaces and so is not available in the NUTTX kernel build

Usage:
    flash_test mtdblock_device

Additional options:

    --force                     to replace existing installation