24 lines
550 B
Markdown
24 lines
550 B
Markdown
# Examples / `flash_test` SMART Flash Device Test
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```
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Author: Ken Pettit
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Date: April 24, 2013
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```
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This application performs a SMART flash block device test. This test performs a
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sector allocate, read, write, free and garbage collection test on a SMART MTD
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block device. This test can be built only as an NSH command
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**Note**: This test uses internal OS interfaces and so is not available in the
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NUTTX kernel build
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```
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Usage:
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flash_test mtdblock_device
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Additional options:
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--force to replace existing installation
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```
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